The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Mar. 11, 2020
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Akihiko Takashima, Musashino, JP;

Masaaki Matsumura, Musashino, JP;

Hajime Noto, Musashino, JP;

Hideaki Kimata, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/50 (2017.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/50 (2017.01); G06V 40/171 (2022.01); G06T 2207/30201 (2013.01);
Abstract

A unit derives displacement amounts of feature points in an entire region of a face shape. A unit derives separated displacement amounts, each of which is a displacement amount of each feature point for every deformation pattern of a partial region of the face shape, based on the displacement amounts of the feature points in the entire region of the face shape and deformation degrees for every deformation pattern of the partial regions. A unit derives normalized and separated displacement amounts, which are obtained by normalizing the separated displacement amounts, for every deformation pattern of the partial regions. A unit generates weight values of the feature points in the entire region of the face shape based on the normalized and separated displacement amounts for every deformation pattern of the partial regions of the face shape and the deformation degrees for every deformation pattern of the partial regions.


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