The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Jan. 24, 2022
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

William Louis Patzoldt, Gilroy, CA (US);

Lee Kamp Redden, Palo Alto, CA (US);

John Chadwick Yagow, Mansfield, IL (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A01B 79/00 (2006.01); G06Q 50/02 (2012.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A01B 79/005 (2013.01); G06Q 50/02 (2013.01); G06T 11/00 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30188 (2013.01);
Abstract

Embodiments relate to a system that generates a crop yield component map for a field. The system determines amounts of nitrogen applied to each portion of the field by a set of nitrogen applicator farming machines. The system accesses crop yield data associated with a crop that was grown in the field. The crop yield data was generated by a set of harvester farming machines that travelled through the field and harvested plant parts of the crop. The system determines, by analyzing the crop yield data, plant part metrics for the harvested plant parts in each field portion. The system generates a crop yield component map that maps, for each field portion, a plant part metric associated with the field portion and an amount of nitrogen applied to the field portion. The component map may then be provided for display.


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