The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Feb. 22, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Sohichiro Nakamura, Ashigarakami-gun, JP;

Ryusuke Osaki, Ashigarakami-gun, JP;

Sho Onozawa, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/10 (2017.01); C12N 5/071 (2010.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); C12N 5/0608 (2013.01); C12N 2506/02 (2013.01); C12N 2506/45 (2013.01); G06T 2207/30024 (2013.01);
Abstract

A determination method of non-destructively and easily determining a state of an aggregate of a plurality of cells formed by three-dimensional culture is provided. A determination method according to the disclosed technology includes generating a phase difference image of an aggregate of a plurality of cells from a hologram obtained by imaging the aggregate, deriving a phase difference amount density by dividing a total phase difference amount that is a value obtained by integrating a phase difference amount of each of a plurality of pixels constituting the phase difference image by a volume of the aggregate, and determining a state of the aggregate on the basis of a time transition of the phase difference amount density.


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