The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Oct. 03, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Wataru Takahashi, Kyoto, JP;

Yusuke Tagawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2024.01); A61B 6/00 (2006.01); G06N 20/00 (2019.01); G06T 5/50 (2006.01); G06T 5/92 (2024.01);
U.S. Cl.
CPC ...
G06T 5/92 (2024.01); A61B 6/5258 (2013.01); G06N 20/00 (2019.01); G06T 5/50 (2013.01);
Abstract

This production method of a trained model () includes a step of optimizing a training model () so that a value of a loss function (A) becomes small. The loss function (A) is configured to output a relatively large value in a case where the contrast of the predetermined area (PA) in a brightness-adjusted image adjusted in brightness becomes high with respect to training data () than in a case where the contrast of the predetermined area in the brightness-adjusted image () becomes low with respect to the training data.


Find Patent Forward Citations

Takahashi, Wataru. (2024). Production method of learned model, brightness adjustment method, and image processing apparatus (U.S. Patent No. 12067699). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12067699

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…