Long short-term memory anomaly detection for multi-sensor equipment monitoring

Abstract

Methods, systems, and non-transitory computer readable medium are provided for long short-term memory (LSTM) anomaly detection for multi-sensor equipment monitoring. A method includes training a LSTM recurrent neural network (RNN) model for semiconductor processing fault detection. The training includes generating training data for the LSTM RNN model and providing the training data to train the LSTM RNN model on first training input and first target output to generate a trained LSTM RNN model for the semiconductor processing fault detection. The training data includes the first training input and the first target output based on normal runs of manufacturing processes of semiconductor processing equipment. Another method includes providing input based on runs of manufacturing processes of semiconductor processing equipment to a trained LSTM RNN model; obtaining one or more outputs from the trained LSTM RNN model; and using the one or more outputs for semiconductor processing fault detection.