The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Jun. 04, 2021
Applicant:
Faro Technologies, Inc., Lake Mary, FL (US);
Inventors:
Matthias Wolke, Korntal-Münchingen, DE;
Prashanth Reddy Patlolla, Stuttgart, DE;
Assignee:
FARO Technologies, Inc., Lake Mary, FL (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); G06F 18/21 (2023.01); G06F 18/23 (2023.01); G06F 30/23 (2020.01); G06T 17/20 (2006.01); G06V 10/75 (2022.01); G06V 10/762 (2022.01);
U.S. Cl.
CPC ...
G06F 18/23 (2023.01); G06F 18/2163 (2023.01); G06F 30/23 (2020.01); G06T 17/20 (2013.01); G06T 19/20 (2013.01); G06V 10/757 (2022.01); G06V 10/762 (2022.01); G06T 2219/2004 (2013.01);
Abstract
Examples described herein provide a method that includes performing cluster matching with one or more cluster sizes for each of a plurality of points of a measurement point cloud. The method further includes determining, based on results of the multi-radii cluster matching, whether an object is displaced or whether the object includes a defect.