The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Nov. 24, 2021
Hexagon Metrology, Inc., North Kingstown, RI (US);
Jonathan J. O'Hare, East Greenwich, RI (US);
Jonathan Dove, Woodstock, IL (US);
Hexagon Metrology, Inc., North Kingstown, RI (US);
Abstract
A system for inspecting each workpiece of a plurality of non-identical workpieces includes a controller in control communication with the instruments of the system, and a ruleset corresponding to one or more such non-identical workpieces, the system reconfiguring the inspection instruments to customize part tending operations for each such non-identical workpiece. A method for inspecting each workpiece of a plurality of non-identical workpiece includes providing a controller in control communication with the instruments of the system, and a ruleset corresponding to each such non-identical workpiece, the controller causing reconfiguration of the inspection instruments to customize part tending operations for each such non-identical workpiece.