The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Sep. 30, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Katsumi Sasata, Minamiashigara, JP;

Fumitake Mitobe, Minamiashigara, JP;

Hiroshi Sato, Minamiashigara, JP;

Yukito Saitoh, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133504 (2013.01); G02F 1/133524 (2013.01); G02F 1/133541 (2021.01); G02F 1/133543 (2021.01); G02B 27/0172 (2013.01);
Abstract

An optical element includes a light guide plate, an incidence portion, and an emission portion, in which each of the incidence portion and the emission portion includes diffraction portions, the diffraction portion includes diffraction elements, the diffraction element includes a liquid crystal diffraction layer in which a direction of an optical axis of a liquid crystal compound changes while continuously rotating in one in-plane direction, and in a case where the direction in which the direction of the optical axis changes is set as an in-plane rotation direction and a length over which the optical axis rotates by 180° is set as an in-plane period, in-plane rotation directions of liquid crystal diffraction layers of incidence diffraction elements in at least two of a plurality of the incidence diffraction portions are different from each other.


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