The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Nov. 20, 2017
Applicant:

Dexerials Corporation, Tokyo, JP;

Inventors:

Shinichi Hayashi, Utsunomiya, JP;

Yasushi Akutsu, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/06 (2006.01); G01R 31/26 (2020.01); H01R 11/01 (2006.01); H01R 43/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/067 (2013.01); G01R 1/06 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); H01R 11/01 (2013.01); H01R 43/00 (2013.01);
Abstract

A conductive particle-disposed film of the present invention useful for a test probe unit for a continuity test of a fine-pitch continuity test object such as a semiconductor device is configured so that conductive particles are disposed in the surface direction of the elastomer film. The thickness of the elastomer film approximately coincides with the average particle diameter of the conductive particles. Ends of the conductive particles are positioned in the vicinity of respective outermost faces of both surfaces of the elastomer film. The same or different conductive particle-disposed films may be layered. A pressure-sensitive adhesive layer may be formed on at least one surface of the conductive particle-disposed film.


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