The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Mar. 04, 2022
Sysmex Corporation, Kobe, JP;
Osaka University, Suita, JP;
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Masaya Okada, Kobe, JP;
Yuki Shimaoka, Kobe, JP;
Shigeki Iwanaga, Kobe, JP;
Kazuki Bando, Suita, JP;
Katsumasa Fujita, Suita, JP;
Yasunori Nawa, Ikeda, JP;
Satoshi Fujita, Ikeda, JP;
SYSMEX CORPORATION, Kobe, JP;
OSAKA UNIVERSITY, Osaka, JP;
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;
Abstract
Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.