The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Oct. 01, 2019
Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;
Hideaki Shishido, Kanagawa, JP;
Takayuki Ikeda, Kanagawa, JP;
Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;
Abstract
A cost of a testing device is reduced. A structure of a testing device is simplified. A testing device capable of testing with higher accuracy is provided. A testing device () has a structure including a sending unit (), a receiving unit (), a control unit (), and a display (). The control unit includes a memory portion () and an arithmetic portion (). The sending unit has a function of generating a pulse signal for a probe () to generate an ultrasonic wave (). The receiving unit has a function of generating a first signal including a first analog data (D) on the basis of the input single input from the probe. The memory portion has a function of storing the first analog data. The arithmetic portion has a function of generating an image signal (S0) output to the display on the basis of the first analog data stored in the memory portion. The display has a function of displaying an image based on the image signal.