The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Dec. 18, 2019
Applicant:

Aspida Dx Inc., Horsham, PA (US);

Inventors:

Hardeep Sanghera, San Jose, CA (US);

Ashutosh Shastry, Santa Clara, CA (US);

David Piehler, Los Gatos, CA (US);

Yun-Pei Chang, Arcadia, CA (US);

Assignee:

Aspida DX Inc., Horsham, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/648 (2013.01); B01L 3/508 (2013.01); G01N 21/6428 (2013.01); B01L 2200/025 (2013.01); B01L 2200/04 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0681 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6482 (2013.01); G01N 2201/0691 (2013.01); G01N 2201/0697 (2013.01);
Abstract

Analyte collection and testing systems and methods, and more particularly to testing systems and methods that achieve significant improvements in the detection of fluorescence signals in the reader by modulating the applied optical excitation. Also described herein are optical detection apparatuses and methods for removable photonic chips that do not require translation for calibration when coupling the photonics chip with the sensing system. Also described herein are methods and apparatuses for accurately calibrating a dilution factor when reading from a photonics chip.


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