The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Jun. 21, 2019
Applicant:

Lonza Sales Ag, Basel, CH;

Inventors:

Young Jun Choi, Cambridge, MA (US);

Damian J. Houde, Plymouth, MA (US);

Delai Chen, Cambridge, MA (US);

Douglas E. Williams, Boston, MA (US);

Assignee:

LONZA SALES AG, Basel, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 15/00 (2024.01); G01N 15/06 (2024.01); G01N 15/075 (2024.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 15/06 (2013.01); G01N 21/6486 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0053 (2013.01); G01N 15/075 (2024.01);
Abstract

Described herein are novel rapid and reliable methods of detection of extracellular vesicles and quantifying extracellular vesicle concentrations and absolute number from various sources, including raw cell harvest. The methods described herein comprise detection of light scattering of extracellular vesicles in biological samples. Extracellular vesicles analyzed by the methods of this application have a stereotypical elution profile distinct from known contaminants. The methods described herein are a significant improvement over the state of the art and fulfills an unmet need in the field of extracellular vesicle manufacturing and quality control.


Find Patent Forward Citations

Loading…