The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Dec. 30, 2021
Applicant:

Daedalus Technology Group, Inc., New York, NY (US);

Inventor:

Nathaniel Polish, New York, NY (US);

Assignee:

Daedalus Technology Group, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 3/14 (2006.01); A01K 29/00 (2006.01);
U.S. Cl.
CPC ...
G01G 3/14 (2013.01); A01K 29/00 (2013.01);
Abstract

An electronic measurement device or electronic scale including an arrangement of multiple low-cost sensors to measure a physical property of an object is disclosed. The electronic measurement device or electronic scale utilizes an accurate and effective calibration method that compensates for the idiosyncrasies of using individual sensors. The electronic measurement device positions a plurality of sensors at predetermined observational locations to provide sensor output signals in response to sensing physical characteristics of the physical property of the object to be measured and combines the different sensor output signals by applying a combined calibration transfer function that represents a calibration function for each of the plurality of sensors to provide a cumulative measurement signal that represents the measurement of the physical property of the object. A centroid of the mass of the object is computed and used to execute different applications.


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