The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Feb. 01, 2023
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Darrell Orlyn Ricke, Winchester, MA (US);

James Harper, Jamaica Plain, MA (US);

Brian S. Helfer, Brookline, MA (US);

Joseph Isaacson, Latham, NY (US);

Adam M. Michaleas, Hudson, NH (US);

Martha S. Petrovick, Barre, MA (US);

Eric Schwoebel, Woburn, MA (US);

Anna Shcherbina, East Palo Alto, CA (US);

Philip Fremont-Smith, Newmarket, NH (US);

James G. Watkins, Sutton, MA (US);

Edward C. Wack, Waltham, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6858 (2018.01); C12Q 1/6869 (2018.01); C12Q 1/6886 (2018.01); G16B 20/00 (2019.01); G16B 40/10 (2019.01);
U.S. Cl.
CPC ...
C12Q 1/6858 (2013.01); C12Q 1/6869 (2013.01); C12Q 1/6886 (2013.01); G16B 20/00 (2019.02); G16B 40/10 (2019.02); C12Q 2600/156 (2013.01);
Abstract

The disclosure provides various systems and methods for identifying individuals from one or more samples. In particular, improved systems and methods of analysis are provided for handling multiple contributors, as well as systems and methods that model not only individual error rates per locus but factor in amplification of errors induced through PCR cycles. In some embodiments, modeling of error rates can be applied in multi-contributor settings to more accurately establish real alleles from artifacts. Other aspects involve application of sequencing in error modeling. Further, methods are provided for determining the presence of common individual DNA profiles in one or more complex DNA mixtures and for deconvolution of multiple complex DNA mixtures into shared individual components. The methods of the disclosure do not require any prior knowledge of individual DNA profiles or contributors to the complex DNA mixtures. Moreover, the methods of the disclosure may use any SNP panel, including those panels already existing and those panels specifically designed to maximize performance characteristics of the methods described herein.


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