The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Nov. 22, 2019
Applicant:

Denka Company Limited, Tokyo, JP;

Inventors:

Akimasa Yuasa, Omuta, JP;

Takahiro Nakamura, Omuta, JP;

Shuhei Morita, Omuta, JP;

Koji Nishimura, Omuta, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 7/12 (2006.01); B32B 9/04 (2006.01); B32B 15/20 (2006.01); B32B 18/00 (2006.01); C04B 37/02 (2006.01); H05K 1/03 (2006.01); H05K 1/09 (2006.01);
U.S. Cl.
CPC ...
C04B 37/026 (2013.01); B32B 7/12 (2013.01); B32B 9/041 (2013.01); B32B 15/20 (2013.01); B32B 18/00 (2013.01); H05K 1/0306 (2013.01); H05K 1/09 (2013.01); B32B 2250/40 (2013.01); B32B 2457/08 (2013.01); C04B 2237/125 (2013.01); C04B 2237/407 (2013.01); C04B 2237/60 (2013.01);
Abstract

A ceramic-copper composite having a flat plate shape, including: a ceramic layer; a copper layer; and a brazing material layer present between the ceramic layer and the copper layer. When a region having a length of 1,700 μm in a long-side direction is a region P on a cut surface of the ceramic-copper composite obtained when the ceramic-copper composite is cut with a plane perpendicular to a main surface of the ceramic-copper composite, an average crystal grain size D1 of copper crystals at least partially present in a region P1 within 50 μm on a side of the copper layer from an interface between the ceramic layer and the brazing material layer in the region P is 30 μm or more and 100 μm or less.


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