The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Mar. 06, 2023
Applicant:

Trumpf Werkzeugmaschinen SE + Co. KG, Ditzingen, DE;

Inventors:

Harald Mathias, Boennigheim, DE;

Florian Raichle, Backnang, DE;

Frederik Koepp, Muenchingen, DE;

Stefan Foerster, Wilthen, DE;

Hagen Jacob, Crostau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D 43/02 (2006.01); B65G 43/08 (2006.01);
U.S. Cl.
CPC ...
B21D 43/02 (2013.01); B65G 43/08 (2013.01); B65G 2203/042 (2013.01);
Abstract

A machine handling device for handling a sheet-metal workpiece includes a control device that comprises two sensing elements, and a testing station that includes a testing device configured to test functional capability of the control device. The testing device includes a respective electrically conductive testing-contact body for each of the two sensing elements of the control device. The testing station further includes a testing-evaluation device configured to apply a testing voltage between the respective sensing element and the corresponding testing-contact body. The testing-evaluation device includes a testing-measuring unit and a testing-comparing unit. The testing-measuring unit is configured to measure an actual value of a contact-dependent electrical variable that is dependent on a state of an electrically conducting contact between the sensing element and the testing-contact body. The testing-comparing unit is configured to compare the actual value of the contact-dependent electrical variable with a reference value of the contact-dependent electrical variable.


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