The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Nov. 03, 2020
Deere & Company, Moline, IL (US);
Zachary A. Meyers, Milan, IL (US);
Stephen R. Corban, Geneseo, IL (US);
Jeremiah K. Johnson, Williamsburg, IA (US);
Alexander B. Lassers, Davenport, IA (US);
DEERE & COMPANY, Moline, IL (US);
Abstract
Embodiments of a kernel-level grain monitoring system include a grain camera positioned to capture bulk grain sample images of a currently-harvested grain taken into and processed by a combine harvester, a moisture sensor, and a display device. A controller architecture is coupled to the grain camera, to the moisture sensor, and to the display device. The controller architecture is configured to: (i) analyze the bulk grain sample images, as received from the grain camera, to determine an average per kernel (APK) volume representing an estimated volume of a single average kernel of the currently-harvested grain; (ii) repeatedly calculate one or more topline harvesting parameters based, at least in part, on the determined APK volume and the moisture sensor data; and (iii) selectively present the topline harvesting parameters on the display device for viewing by an operator of the combine harvester.