The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Apr. 28, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Mihir Vijay Laghate, San Diego, CA (US);

Mingming Cai, San Jose, CA (US);

Raghu Narayan Challa, San Diego, CA (US);

Michael Burke, Morris Plains, NJ (US);

Revathi Sundara Raghavan, San Diego, CA (US);

Siddharth Kamath, San Jose, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/28 (2009.01); H04B 7/0408 (2017.01); H04B 7/0456 (2017.01); H04B 7/06 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 16/28 (2013.01); H04B 7/0408 (2013.01); H04B 7/0469 (2013.01); H04B 7/0617 (2013.01); H04W 24/10 (2013.01);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a UE may communicate via a serving beam set of the UE, the serving beam set being one or more of a plurality of beams. The UE may measure another beam set in accordance with a measurement schedule configured to prioritize measurement on one or more adjacent beam sets associated with the serving beam set over one or more non-adjacent beam sets associated with the serving beam set. In some aspects, the one or more adjacent beam sets may be associated with one or more coverage areas that at least partially overlap a coverage area of the serving beam set, are adjacent to the coverage area of the serving beam set, or are associated with a measurement value that satisfies a threshold in the coverage area of the serving beam set. Numerous other aspects are provided.


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