The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Sep. 16, 2022
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Michael C. Fanning, Redmond, WA (US);

Suvam Mukherjee, Allston, MA (US);

Danielle Nicole Gonzalez, LeRoy, NY (US);

Christopher Michael Henry Faucon, Redmond, WA (US);

Pragya Prakash, Amherst, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/77 (2018.01);
U.S. Cl.
CPC ...
G06F 8/77 (2013.01);
Abstract

Static analysis of a code base is expanded beyond finding faults to also find code instances where a particular fault could have occurred but did not. A conformance count reflects code portions that satisfy a specified coding rule per static analysis, and a nonconformance count reflects code portions that do not satisfy the coding rule. Various metrics computed from the conformance count and nonconformance count drive software development quality assessments. For example, bugs or bug categories may be prioritized for developer attention, static analysis tools are evaluated based on the metrics, to reduce noise by eliminating low-value bug alerts. Particular areas of expertise of developers and developer groups are objectively identified. Source code editors are enhanced to provide specific recommendations in context. Other quality enhancements are also provided.


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