The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Jan. 29, 2019
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Shane Colburn, Seattle, WA (US);

Alan Zhan, Seattle, WA (US);

Arka Majumdar, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); G02B 27/00 (2006.01); G02B 27/42 (2006.01); H04N 9/03 (2023.01); H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
G02B 3/0056 (2013.01); G02B 27/0075 (2013.01); G02B 27/4211 (2013.01); H04N 9/03 (2023.01); H04N 23/67 (2023.01);
Abstract

Metasurfaces and systems including metasurfaces for imaging and methods of imaging are described. Such metasurfaces may be formed on a substrate from a plurality of posts. The metasurfaces are configured to be optically active over a wavelength range and in certain embodiments are configured to form lenses. In particular, the metasurfaces described herein may be configured to focus light passed through the metasurface in an extended depth of focus. Accordingly, the disclosed metasurfaces are generally suitable for generating color without or with minimal chromatic aberrations, for example, in conjunction with computational reconstruction.


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