The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Mar. 15, 2021
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Takeshi Matsui, Tokyo, JP;

Hirokazu Tatsuta, Tokyo, JP;

Mitsunori Ueda, Tokyo, JP;

Seiji Wada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/74 (2023.01); G02B 21/00 (2006.01); G02B 21/08 (2006.01); G02B 21/24 (2006.01); H04N 23/67 (2023.01); H04N 23/71 (2023.01);
U.S. Cl.
CPC ...
G02B 21/241 (2013.01); G02B 21/0032 (2013.01); G02B 21/008 (2013.01); G02B 21/08 (2013.01); H04N 23/673 (2023.01); H04N 23/71 (2023.01); H04N 23/74 (2023.01);
Abstract

A microscope system includes: a light source unit that emits linear illumination parallel to a first direction; an objective lens that condenses the linear illumination onto a measurement target region; an acquisition unit that acquires a first optical signal indicating a light intensity value of light emitted from the measurement target region by the linear illumination; and a focus control unit that controls at least one of a relative position or a relative posture of the light source unit and an imaging unit that generates the first optical signal on a basis of a light intensity distribution of the first optical signal.


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