The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2024
Filed:
Mar. 27, 2020
The Curators of the University of Missouri, Columbia, MO (US);
Matthew Dvorsky, Rolla, MO (US);
Mohammed Tayeb Al Qaseer, Rolla, MO (US);
Reza Zoughi, Wildwood, MO (US);
THE CURATORS OF THE UNIVERSITY OF MISSOURI, Columbia, MO (US);
Abstract
A microwave and millimeter wave imaging system. In either a far-field or a near-field detection mode, a radially-polarized probe transmits an imaging signal along a predetermined scan path to detect a target in a sample. The imaging signal's orientation is independent of the target's orientation and changes at each target as the probe transmits the signal during scanning. A measurement system receives scattered waves reflected from the sample via a single channel and images the sample and the target based on the reflected waves independent of the orientation of the target.