The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2024
Filed:
Nov. 02, 2020
Nima Acquisition, Llc, Northfield, IL (US);
Scott Sundvor, San Francisco, CA (US);
Steven Portela, San Francisco, CA (US);
Jonathan Ward, San Francisco, CA (US);
John Walton, Cambridge, MA (US);
Jonathan William Kiel, Ardmore, PA (US);
Jeffrey Mekler, Cambridge, MA (US);
Shireen Yates, San Francisco, CA (US);
Jacob Mooney, Westford, MA (US);
Nima Acquisition, LLC, Northfield, IL (US);
Abstract
A system and method for detecting harmful substances within a consumable sample comprising: receiving a consumable sample at a first chamber of a test container; transforming the consumable sample into a homogenized sample upon processing of the consumable sample; delivering the homogenized sample to a second chamber of the test container, wherein the second chamber is configured to receive the homogenized sample comprises an outlet port; mixing the homogenized sample with a process reagent within the second chamber, thereby producing a dispersion; transmitting a volume of the dispersion to an analysis chamber, of the test container, configured to position a detection substrate proximal the port of the second chamber and comprising a detection window that enables detection of presence of the allergen; and detecting presence of the allergen within the consumable sample by way of an optical sensor configured to detect signals indicative of the allergen through the detection window.