The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Feb. 05, 2020
Applicant:

Smartdyelivery Gmbh, Jena, DE;

Inventors:

Christoph Englert, Jena, DE;

Marc Lehmann, Jena, DE;

Ivo Nischang, Jena, DE;

Ulrich Schubert, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/04 (2006.01); G01N 11/00 (2006.01); G01N 33/543 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/042 (2013.01); G01N 11/00 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/045 (2013.01);
Abstract

The invention relates to a method for determining the physicochemical properties of a nanoscale system (NSS) using analytical ultracentrifugation), comprising the steps of generating a multi-dimensional sedimentation analysis map associated with the NSS of interest; selecting sample-dependent parameters; determining sedimentation coefficient value/parameter in the sample; inserting sample sedimentation coefficient values onto the multi-dimensional sedimentation analysis map to obtain a NSS sample map value; and inferring from the NSS sample map value the physicochemical properties of the NSS sample. Furthermore, the invention relates to a system for performing the method, a computer program product and a computer readable storage medium.


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