The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

May. 13, 2022
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Yuji Miyaki, Osaka, JP;

Shuji Shimonaka, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 5/012 (2013.01);
Abstract

Provided are a probe for a three-dimensional coordinate measuring device that enable calculation of coordinates of a measurement point of a measurement target with high accuracy. The probe is used in the three-dimensional coordinate measuring device that calculates coordinates of a measurement point of a measurement target. In the probe, a plurality of markers whose image is captured by an imaging unit are held by a probe holding unit. A stylus, which is brought into contact with the measurement target to specify the measurement point, is attached to the probe holding unit. The stylus has a predetermined positional relationship with respect to the plurality of measurement markers. The probe holding unit is connected to a probe casing in a freely movable manner. A magnetic sensor that outputs a signal corresponding to a displacement amount of the probe holding unit with respect to the probe casing is provided inside the probe casing.


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