The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2024

Filed:

Jun. 15, 2021
Applicant:

Autochips Wuhan Co., Ltd., Wuhan, CN;

Inventor:

Tao Zhang, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60C 23/00 (2006.01); B60C 23/04 (2006.01); B60K 35/00 (2006.01); B60K 35/28 (2024.01);
U.S. Cl.
CPC ...
B60C 23/0416 (2013.01); B60C 23/0488 (2013.01); B60K 35/00 (2013.01); B60K 35/28 (2024.01); B60K 2360/168 (2024.01); B60K 2360/171 (2024.01);
Abstract

The present disclosure provides a left and right wheel determination method, a wheel pressure monitoring chip and system, and related apparatuses. The left and right wheel determination method includes: obtaining a time duration for a wheel to rotate for a predetermined number of revolutions after the wheel being detected as rotating; sampling centrifugal acceleration and tangential acceleration of the wheel within the time duration; determining an overrun-lag relationship between the centrifugal acceleration and the tangential acceleration of the wheel based on a serial number of a sampling time-point corresponding to the centrifugal acceleration and a serial number of a sampling time-point corresponding to the tangential acceleration; and determining the wheel to be of a left wheel or a right wheel based on the overrun-lag relationship between the centrifugal acceleration and the tangential acceleration of the wheel.


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