The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Mar. 31, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Fangli Xu, Beijing, CN;

Sethuraman Gurumoorthy, San Ramon, CA (US);

Huaning Niu, San Jose, CA (US);

Yushu Zhang, Beijing, CN;

Chunhai Yao, Beijing, CN;

Wei Zeng, Saratoga, CA (US);

Haitong Sun, Cupertino, CA (US);

Weidong Yang, San Diego, CA (US);

Dawei Zhang, Saratoga, CA (US);

Sigen Ye, Whitehouse Station, NJ (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/23 (2023.01); H04L 1/00 (2006.01); H04L 5/00 (2006.01); H04W 72/044 (2023.01); H04W 72/0446 (2023.01);
U.S. Cl.
CPC ...
H04W 72/23 (2023.01); H04L 1/0061 (2013.01); H04L 5/0048 (2013.01); H04L 5/0094 (2013.01); H04W 72/0446 (2013.01); H04W 72/0466 (2013.01);
Abstract

An approach to reduce the signaling overhead for tracking reference signal (TRS) configuration signaling to idle and inactive user equipments (UEs) operating in a wireless communication system. Conventional signaling approaches require more bits that can be conveyed in the maximum system information block (SIB) message size. One proposed approach optimizes the signaling by removing unnecessary or redundant information, using a single TRS configuration to replace multiple configurations, size reduction in some fields, and the sharing of some fields across different TRS configurations. Another proposed approach uses an SIB message to carry the TRS configurations for a particular beam or subset of beams. These two proposed approaches may be combined to provide further optimization possibilities.


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