The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Feb. 07, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Noboru Nagatani, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/00 (2006.01); H04L 9/40 (2022.01); H04L 45/02 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); H04L 45/02 (2013.01); H04L 63/1416 (2013.01); H04L 63/145 (2013.01);
Abstract

The topology identification unitidentifies a network topology of devices included in a system to be diagnosed. The detection unitdetects attack routes that indicate flows of attacks that can be executed in the system to be diagnosed, based on security information about each device. The time information identification unitidentifies time information that represents degree of time required to attack a device, for each device on each attack route. The display control unitdisplays the attack routes on a display device by superimposing the attack routes on the network topology. At this time, the display control unitdisplays each attack route on the display device in a manner that allows a user to recognize degree of spread of attack along each attack route, based on the time information identified for each device on each attack route.


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Nagatani, Noboru. (2024). Analysis system, method, and program (U.S. Patent No. 12058164). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12058164

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