The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Aug. 20, 2020
Applicant:

Cerner Innovation, Inc., Kansas City, KS (US);

Inventors:

Brian Streich, Kansas City, MO (US);

Nathan Richard Sorensen, Overland Park, KS (US);

Anand Baradwaj, Karnataka, IN;

George Bennett Fritts, Lee's Summit, MO (US);

Assignee:

Cerner Innovation, Inc., Kansas City, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06Q 10/0631 (2023.01); G06Q 10/0637 (2023.01); G06Q 10/10 (2023.01); G06Q 10/101 (2023.01); G06Q 10/105 (2023.01); G06Q 10/109 (2023.01); G06Q 40/12 (2023.01); G16H 10/60 (2018.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06Q 10/063112 (2013.01); G06Q 10/06375 (2013.01); G06Q 10/101 (2013.01); G06Q 10/103 (2013.01); G06Q 10/105 (2013.01); G06Q 10/109 (2013.01); G06Q 40/12 (2013.12); G16H 10/60 (2018.01);
Abstract

Methods, computer systems, and computer storage media are provided for utilizing system diagnostics focused in areas of disruption to improve inventory and workforce management in a revenue cycle management system. Diagnostic data is utilized to automatically identify disruptions in the revenue cycle management system across a plurality of clients. The disruptions are automatically ranked based on an impact to the revenue cycle management system and a time required to execute a correction for each disruption. A recommendation is provided for the client to execute the correction for each disruption.


Find Patent Forward Citations

Loading…