The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Sep. 17, 2021
Silicon Works Co., Ltd., Daejeon, KR;
Min Ji Lee, Daejeon, KR;
Jun Young Park, Daejeon, KR;
Ji Won Lee, Daejeon, KR;
Suk Ju Kang, Daejeon, KR;
Yu Lim Seo, Daejeon, KR;
Jung Hyun Kim, Daejeon, KR;
SILICON WORKS CO., LTD., Daejeon, KR;
Abstract
Disclosed are an apparatus and method for evaluating the degradation of a display panel, for evaluating a degradation state of a display panel, such as mura. The method of evaluating the degradation of a display panel may be implemented by generating mutual information by using a first histogram distribution vector of a reference frame having a target grayscale level and a second histogram distribution vector of an evaluation frame displayed on a display panel in response to the target grayscale level, generating normalized mutual information of the mutual information, providing a weight into which a cognitive characteristic of a distribution of grayscales of pixels of the evaluation frame is incorporated, and outputting an evaluation value obtained by multiplying the normalized mutual information and the weight.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile