The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jan. 23, 2020
Applicants:

Omron Corporation, Kyoto, JP;

Kyoto University, Kyoto, JP;

Inventors:

Atsushi Hashimoto, Tokyo, JP;

Yuta Kamikawa, Tokyo, JP;

Yoshitaka Ushiku, Tokyo, JP;

Masaaki Iiyama, Kyoto, JP;

Motoharu Sonogashira, Kyoto, JP;

Assignees:

OMRON Corporation, Kyoto, JP;

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/58 (2022.01); G06T 7/20 (2017.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 20/58 (2022.01); G06T 7/20 (2013.01); G06V 10/7747 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A model generation apparatus according to one aspect of the present invention acquires a plurality of learning datasets each constituted by a first sample of a first time of predetermined data obtained in time series and feature information included in a second sample of the predetermined data of a future second time relative to the first time, and trains a prediction model, by machine learning, to predict feature information of the second time from the first sample of the first time, for each learning dataset. In the model generation apparatus, a rarity degree for is set each learning dataset, and, in the machine learning, the model generation apparatus trains more preponderantly on learning datasets having a higher rarity degree.


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