The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Feb. 18, 2020
Samsara Inc., San Francisco, CA (US);
Evaline Shin-Tin Tsai, Cupertino, CA (US);
Kieran K. Gupta, San Francisco, CA (US);
Margaret Irene Finch, San Francisco, CA (US);
Matthew Lee Basham, Oakland, CA (US);
Bodecker John DellaMaria, San Francisco, CA (US);
Brian Tuan, Cupertino, CA (US);
James Chen, San Francisco, CA (US);
Jason Noah Laska, San Francisco, CA (US);
Jason Frederic Symons, Dublin, CA (US);
John Charles Bicket, San Francisco, CA (US);
Kavya Joshi, San Francisco, CA (US);
Ryan Reading, San Francisco, CA (US);
Sabrina Quinn Shemet, San Francisco, CA (US);
Sean Kyungmok Bae, San Francisco, CA (US);
Ishaan Kansal, San Francisco, CA (US);
Samsara Inc., San Francisco, CA (US);
Abstract
An event detection system to operations that include: detecting an event based on at least a portion of the sensor data, the event comprising a plurality of event attributes; determining one or more event attributes from the plurality of event attributes of the event transgress a threshold value; and causing display of a notification that includes a presentation of at least the portion of the sensor data in response to the determining that the one or more event attributes from among the plurality of event attributes of the event transgress the threshold value.