The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jan. 01, 2020
Applicant:

Gorilla Technology Inc., Taipei, TW;

Inventors:

Sze-Yao Ni, Taipei, TW;

Kuo-Chen Wu, Taipei, TW;

Wen-Yueh Chiu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/11 (2017.01); G06T 7/20 (2017.01); G06V 10/25 (2022.01); G06V 10/776 (2022.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06V 10/25 (2022.01); G06T 7/11 (2017.01); G06T 7/20 (2013.01); G06V 10/776 (2022.01); G06V 20/52 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30248 (2013.01);
Abstract

A method and system of evaluating a valid analysis region of a specific scene, wherein the method and system performs image analyses on continuous images/frames of a specific scene to obtain detectable object or event information therein, so as to generate a closed valid analysis region to reduce the overall data and loading of image analyses during actual monitoring, processing and analyzing of the specific scene.


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