The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Mar. 10, 2021
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Yoshinori Sasagawa, Kobe, JP;
Yoshiaki Miyamoto, Kobe, JP;
Kazumi Hakamada, Kobe, JP;
Kengo Gotoh, Kobe, JP;
Yosuke Sekiguchi, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2023.01); G06T 7/11 (2017.01); G06T 7/187 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06N 3/08 (2013.01); G06T 7/11 (2017.01); G06T 7/187 (2017.01); G06V 20/695 (2022.01); G06T 2207/10064 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30024 (2013.01);
Abstract
An image analysis method according one or more embodiments may analyze a form of a cell using a deep learning algorithm with a structure of a neural network. The image analysis method may include: generating data for analysis from an image for analysis in which an analysis target cell is captured; inputting the data for analysis into the deep learning algorithm; and generating data indicating a form of the analysis target cell using the deep learning algorithm.