The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Feb. 03, 2021
International Business Machines Corporation, Armonk, NY (US);
Jing James Xu, Xi'an, CN;
Lei Gao, Xi'an, CN;
A Peng Zhang, Xi'an, CN;
Rui Wang, Xi'an, CN;
Si Er Han, Xi'an, CN;
Xiao Ming Ma, Xi'an, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for identifying influential effects that contribute most to a status change of a target index for goal seeking analysis. The method includes generating a candidate list of significant changed predictors between the normal and abnormal status time periods in collected data, and building a plurality of regression models from the collected data. The method determines a first value (trend value or Pearson correlation value) for each of the significant changed predictors based on whether at least one of the significant changed predictors have a significant change trend using the regression models. The method obtains a second predictor importance value for each of the significant changed predictors from a single model built on all the collected data. The method generates a final predictor value for each of the significant changed predictors by combining the first value with the second predictor importance value for each of the significant changed predictors.