The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
May. 18, 2021
Sap SE, Walldorf, DE;
Rui Ban, Xi'an, CN;
Bowen Ren, Xi'an, CN;
Yucheng Guo, Xi'an, CN;
Jingyuan Li, Xi'an, CN;
Jingtao Li, Xi'an, CN;
Wenbin Zhao, Xi'an, CN;
Yan Ke, Xi'an, CN;
Li-Ping Sun, Xi'an, CN;
SAP SE, Walldorf, DE;
Abstract
Embodiments relate to diagnosis and recovery of cloud based systems. From an incident ticket, a dynamic diagnostics graph is generated visualizing a hierarchy (ancestor, child) of diagnostic jobs investigating the functioning cloud system. By indicating and checking job statuses, child jobs dependent on a skipped or failed job can be skipped according to a dynamic pruning technique—thereby trimming an entire branch. And, by running separate groups of diagnostic jobs in parallel across different nodes, the diagnostic process can be finished rapidly and efficiently. A diagnostic report includes the dynamic diagnostics graph. For system recovery, the dynamic diagnostic graph is analyzed to automatically provide one or more appropriate Recommended Actions (RAs) resolving cloud system problem(s) revealed by diagnostic efforts. Those appropriate RAs may be provided by performing machine learning (e.g., referencing a neural network) with a model trained from historical cloud diagnostic and recovery activity.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile