The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jan. 09, 2023
Applicant:

Tableau Software, Llc, Seattle, WA (US);

Inventor:

Andrew C. Beers, Seattle, WA (US);

Assignee:

Tableau Software, LLC, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/26 (2019.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/26 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Embodiments are directed to generating metrics based on visualizations. A dashboard that may be associated with source visualizations display a current value of metrics from source visualization models. A classifier may automatically use characteristics from the source visualizations to determine metrics for the source visualization. The source visualization models may be sample to provide values of the metrics across time, at a sampling rate determined by a metric profile. The sampled values may be stored with time values in a metric data store such that the time values may correspond to when the values sampled from the visualization. Metric visualizations may be generated based on the values and the time values such that the metric visualizations display previously sampled values of the metrics.


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