The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

May. 10, 2023
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Pezhman Jasper Sheini, Sterling, VA (US);

Manish Marwah, Pleasanton, CA (US);

Martin Fraser Arlitt, Calgary, CA;

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/10 (2019.01); G06F 16/13 (2019.01); G06F 16/16 (2019.01); G06F 16/17 (2019.01);
U.S. Cl.
CPC ...
G06F 16/1734 (2019.01); G06F 16/13 (2019.01); G06F 16/16 (2019.01);
Abstract

Embodiments of the disclosure provide systems and methods for analyzing log files. Automated processing of log files can comprise reading a log file generated during execution of an application and comprising a plurality of log events and generating a plurality of templates based on the plurality of log events in the log file. Each template can map a log event to a candidate value for the log event. The plurality of log events can be aggregated into a plurality of groups based on the candidate value mapped to each log event in the plurality of templates and the plurality of groups of log events can be ranked. The log file can be partitioned based on the ranking of the plurality of groups of log events and one or more groups of log events can be provided to an analysis process based on the partitioning of the log file.


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