The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Dec. 24, 2021
Applicant:

Vmware Llc, Palo Alto, CA (US);

Inventors:

Agila Govindaraju, Bangalore, IN;

Rutuja Dhamale, Bangalore, IN;

Charitha Gurram, Bangalore, IN;

Ramya Bangera, Bangalore, IN;

Auroprava Rout, Bangalore, IN;

Assignee:

VMware LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 9/451 (2018.01); G06F 9/455 (2018.01); G06F 9/54 (2006.01); G06N 5/02 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3495 (2013.01); G06F 9/451 (2018.02); G06F 9/45558 (2013.01); G06F 9/542 (2013.01); G06N 5/02 (2013.01); G06N 20/00 (2019.01); G06F 2009/45591 (2013.01);
Abstract

In one example, a computing node includes a metric dependency graph knowledge base to store a data structure representing a relationship between a plurality of metrics. Further, the computing node may include a processor and a memory having a metric recommendation unit. The metric recommendation unit may determine a first metric of a monitored computing-instance while a user interacts with a GUI of a monitoring application. Further, the metric recommendation unit may retrieve the data structure corresponding to the first metric. The data structure may include the first metric and a plurality of dependent metrics associated with the first metric. Further, the metric recommendation unit may apply a machine learning model on the data structure to determine a second metric from the plurality of dependent metrics. Furthermore, the metric recommendation unit may output the second metric related to the first metric on the GUI.


Find Patent Forward Citations

Govindaraju, Agila. (2024). Related metrics-based monitoring of computing-instances (U.S. Patent No. 12056039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12056039

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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