The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jul. 30, 2021
Applicant:

Inspur Suzhou Intelligent Technology Co., Ltd., Jiangsu, CN;

Inventor:

Yongfei Sun, Jiangsu, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/22 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3055 (2013.01); G06F 11/22 (2013.01); G06F 11/3006 (2013.01); G06F 11/3452 (2013.01);
Abstract

A method and a system for determining interval time for testing of a server, and a device and a storage medium are provided. The method includes: evenly dividing multiple servers into multiple groups of servers, and performing multiple rounds of testing on each group of servers; calculating performance values of each group of servers in each round of testing according to a weight corresponding to each influencing factor, and packaging and writing the performance values and interval time corresponding to the performance values in a database; and collecting, at every other preset time, current values corresponding to influencing factors in an actual running process of a server, calculating a current performance value of the server based on the current values according to the weight corresponding to the respective one of the one or more influencing factors, and determining, from the database, interval time corresponding to the current performance value.


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