The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Aug. 13, 2021
Applicant:

Mitsubishi Logisnext Co., Ltd., Nagaokakyo, JP;

Inventors:

Kenji Takao, Tokyo, JP;

Takumi Fujita, Tokyo, JP;

Katsumasa Kitajima, Tokyo, JP;

Yusuke Kinouchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2024.01); B66F 9/06 (2006.01); G01S 17/89 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G05D 1/0242 (2013.01); B66F 9/063 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

Pallet detection device that acquires point cloud data indicating a point cloud measured by a two-dimensional distance measurement device on a depth map; detects a straight line corresponding to a front surface of a pallet based on the point cloud in a region presumed to include the front surface of the pallet in the point cloud data; detects a line segment indicating the front surface of the pallet based on the straight line; acquires position and orientation of the pallet based on the line segment. Acquires one or more straight line candidates and assigns for each of the one or more straight line candidates a score to the point cloud and selects the straight line from the one or more straight line candidates based on a score accumulated value obtained by accumulating the score for the point cloud in the region presumed to include the front surface of the pallet.


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