The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Mar. 04, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Patrick Ruch, Pratval, CH;

Erich M. Ruetsche, Pfaeffikon, CH;

Gero Dittmann, Zürich, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06F 16/182 (2019.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 19/4183 (2013.01); G06F 16/1837 (2019.01); H04L 9/3247 (2013.01);
Abstract

Embodiments are disclosed for a quality control method. The method includes verifying one or more sensors as part of a verification process and assessing a quality of an item or a technical process as part of a quality control process. Two or more measurements values characterizing the item or the technical process from the one or more sensors are obtained. One or more output values based on a computerized process taking the two or more measurements values as inputs are obtained. At least one of the output values obtained is compared to one or more corresponding reference values, to obtain a quality assessment of the item or the technical process.


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