The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Nov. 17, 2020
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for generating a resultant test plan for testing a measurement object includes generating at least one data record by measuring the measurement object. The method includes assigning at least part of the measurement object to at least one object class based on the at least one data record. The method includes determining a test plan assigned to the at least one object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment of the at least part of the measurement object to the at least one object class is independent of dimensions.