The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
Mar. 31, 2020
Trumpf Werkzeugmaschinen SE + Co. KG, Ditzingen, DE;
Simon Ockenfuss, Renningen, DE;
Harald Mathias, Boennigheim, DE;
TRUMPF Werkzeugmaschinen GmbH + Co. KG, Ditzingen, DE;
Abstract
A method for recognition and compensation of an offset measure between stamping coordinates of a stamping device and laser coordinates of a laser device in a combined stamping-laser machine for processing a plate-shaped workpiece, particularly a metal sheet, includes introducing a structure into the plate-shaped workpiece by respectively using the stamping device or the laser device. A measurement variable of the introduced structure is determined respectively by the laser device or the stamping device. The measurement variable is compared with an expected variable, and a deviation of the measurement variable from the expected variable corresponds to an offset measure. The offset measure is balanced with the coordinates of the laser device in the laser coordinate system or with the coordinates of the stamping device in the stamping coordinate system in order to compensate for the offset measure between the stamping coordinates and the laser coordinates.