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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12055742 B1

PDFFull Text
Date of Patent:
Aug. 06, 2024

Filed:

Sep. 08, 2020

Polarization diffraction element and vector beam mode detection system using the same

Applicants:

Hayashi Telempu Corporation, Aichi, JP;

Nagaoka University of Technology, Niigata, JP;

University of Hyogo, Hyogo, JP;

Inventors:

Takeya Sakai, Aichi, JP;

Moritsugu Sakamoto, Niigata, JP;

Hiroshi Ono, Niigata, JP;

Nobuhiro Kawatsuki, Hyogo, JP;

Assignees:

HAYASHI TELEMPU CORPORATION, Aichi, JP;

NAGAOKA UNIVERSITY OF TECHNOLOGY, Niigata, JP;

UNIVERSITY OF HYOGO, Hyogo, JP;

Attorney:

Kagan Binder, PLLC

Primary Examiner:

Stephone B Allen

Assistant Examiner:

Jyotsna V Dabbi

Int. Cl.
CPC ...
G02B 5/32 (2006.01); C09K 19/38 (2006.01); G01J 4/00 (2006.01); G02B 27/09 (2006.01); G03H 1/02 (2006.01); G03H 1/28 (2006.01);
U.S. Cl.
CPC ...
G02B 5/32 (2013.01); C09K 19/3852 (2013.01); G01J 4/00 (2013.01); G02B 27/0927 (2013.01); G03H 1/0256 (2013.01); G03H 1/28 (2013.01); G03H 2001/0264 (2013.01); G03H 2240/15 (2013.01); G03H 2250/38 (2013.01); G03H 2260/12 (2013.01);
Abstract

A polarization diffraction element comprising including a film including a liquid crystalline material having photosensitivity, the film having at least one hologram recorded therein, and thereby having a property as a fork-shaped polarization grating having an anisotropic structure in which an optical axis continuously rotates toward a direction of a grating vector.

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Sakai, Takeya. (2024). Polarization diffraction element and vector beam mode detection system using the same (U.S. Patent No. 12055742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12055742

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