The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2024
Filed:
May. 09, 2022
Nec Corporation, Tokyo, JP;
Masanori Sekido, Tokyo, JP;
Naoya Nakayama, Tokyo, JP;
Shinichi Morimoto, Tokyo, JP;
Masayuki Ariyoshi, Tokyo, JP;
Toshinori Takemura, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An inspection system acquires an inspection target person image including an inspection target person, irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter toward the inspection target person and receives a reflection wave, performs detection processing of detecting an anomalous state based on a signal of the reflection wave, causes a storage unit to store tracking target person information indicating an external appearance of a tracking target person being the inspection target person in which the anomalous state is detected, acquires a worker peripheral image including scenery in the periphery of a worker; detects the tracking target person from the worker peripheral image based on the tracking target person information, and notifies the worker of a position of the tracking target person detected from the worker peripheral image.