The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Jun. 23, 2021
Applicant:

Zhejiang University, Hangzhou, CN;

Inventors:

Xingchang Wei, Hangzhou, CN;

Li Zhang, Hangzhou, CN;

Assignee:

ZHEJIANG UNIVERSITY, Hangzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01);
Abstract

The present application discloses calibration system and method for an electric field probe and a magnetic field probe based on multiple components. The system includes a microstrip line calibration assembly, a clamp, a vector network analyzer and a data processing unit; two groups of microstrip lines included in the microstrip line calibration assembly can be distributed on different routing layers of the same PCB board or on independent PCB boards; the first group of microstrip lines is single microstrip lines or differential lines under common mode excitation, which are used to generate a main component Hof a magnetic field, and the second group of microstrip lines is differential lines under differential mode excitation, which are used to generate a main component Eof an electric field.


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