The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

May. 27, 2019
Applicant:

Nsk Ltd., Tokyo, JP;

Inventors:

Hiroki Ueda, Kanagawa, JP;

Manabu Kishida, Kanagawa, JP;

Nobuaki Takana, Kanagawa, JP;

Assignee:

NSK LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 7/00 (2006.01); C12M 1/00 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01); G02B 21/26 (2006.01); G02B 21/32 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0099 (2013.01); G01N 35/00584 (2013.01); G01N 35/1065 (2013.01); G02B 21/26 (2013.01); G02B 21/32 (2013.01); G02B 21/36 (2013.01);
Abstract

A manipulation system includes a sample stage configured such that a minute object is placed thereon, a first manipulator including a first pipette for holding the minute object, a second manipulator including a second pipette for manipulating the minute object that is held to the first pipette, an imaging unit configured to image the minute object, and a control unit configured to control the sample stage, the first pipette, the second pipette, and the imaging unit. The control unit moves the second pipette to a direction approaching the sample stage from the upper side of the minute object, at a position where the second pipette overlaps with the minute object and is away from the center of the minute object in a direction orthogonal to the extending direction of the second pipette, when viewed from the direction perpendicular to the sample stage.


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