The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2024

Filed:

Oct. 27, 2023
Applicant:

Uster Technologies Ag, Uster, CH;

Inventors:

Peyman H. Dehkordi, Knoxville, TN (US);

Kent A. Rinehart, Knoxville, TN (US);

David D. McAlister, III, Knoxville, TN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/55 (2014.01); G01N 33/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 21/55 (2013.01); G01N 33/367 (2013.01); G01N 2021/6471 (2013.01); G01N 2201/062 (2013.01); G01N 2201/127 (2013.01);
Abstract

An apparatus for measuring not only the reflected radiation but also the fluorescence emission of a textile sample, which includes a presentation subsystem having a viewing window. A radiation subsystem has a tunable radiation source for directing a desired radiation having a wavelength range and an intensity through the viewing window toward the sample, and thereby causing the sample to produce a fluorescence. A sensing subsystem has an imager for capturing the reflected radiation and fluorescence in an array of pixels. A control subsystem has a processor, for controlling the presentation subsystem, the radiation subsystem, and the sensing subsystem, and creates a reflected radiation and fluorescence image containing both spectral information and spatial information in regard to the reflected radiation and fluorescence #843 of the sample.


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